{"product_id":"scanning-electron-microscopy","title":"Scanning Electron Microscopy","description":"\u003cb\u003eScanning Electron Microscopy \u003c\/b\u003eprovides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.","brand":"Springer","offers":[{"title":"Default Title","offer_id":45787751743535,"sku":"9783642083723","price":379.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0770\/2855\/6847\/files\/imageloader_a0b3a5e9-69ed-40fe-8b6d-ad3a26ad1ce6.jpg?v=1786149837","url":"https:\/\/tssbooks.com\/products\/scanning-electron-microscopy","provider":"tssbooks","version":"1.0","type":"link"}